Wavetek 132 Especificações descarregar pdf (Página 82)

X(f)

=

j-

[S(f

+

20000

)

+

b(f

-

20000

)]

+

k

—

[b(f

+

19000

)

+

b(f

-

19000

)]

2

a

2

%

+

k

a

-^—

[b(f

+

21000

)

+

b(f

-

21000

)]

+

k-^—

[b(f

♦

17000

)

+

b(f

-

17000

)]

+

k

a

-^—

[b(f

+

23000

)

+

b(f

-

23000

)]

+

k

a

—^—

[b(f

+

15000

)

+

b(f

-

15000

)]

a

6

%

fl

10

%

+

*

—^—

[b(f

+

25000

)

+

6(/"-

25000

)]

a

1

0

it

Q:

Using

the

crosshairs

on

the

RAPIDS

system,

measure

the

modulation

index

for

each

case.

How

does

this

effect

the

output

of

the

envelope

detector?

A:

<100%

:

[(5-1.6)/(5

+

1.6)]

x

100

=

51.5%,

k

a

=

.515

=100%

:

[(2.6-0)/(2.6

+

0)]

x

100

=

100%,

k,=

1

>100%

:

[(1.5-(-.8))/(1.5

+(-.8))]

x

100

=

328.6%,

1^=

3.2857

Q:

Compute

and

draw

the

spectra

of

of

the

modualted

sine

wave.

A:

x(t)

=

1

[1

+

k

irä.2

n;

1000

*]

sin

2

%

20000

t

X(f)

=

j-

[&(f

+

20000

)

+

b(f

-

20000

)

+

k

a

[b(f

+

19000

)

+

b(f

-

19000

)

+

k

[b(f

♦

21000

)

+

b(f

-

21000

)]

Lab

3

Solutions

Page

2

72

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